We offer high magnification IMAGING with a rapid turnaround.
scanning electron microscopy
When combined with the decades of experience of our operators, our Scanning Electron Microscopy (SEM) lab provides a powerful and effective micro analysis technique. SEM microscopy is an effective tool in failure analysis, contaminant analysis, and general micro analysis. Images produced by a fracture surface are often used to determine the mode and mechanism of a failure.
The scanning electron microscopes will allow you to view surface features at 5 to 300,000X magnification to provide you with high quality, depth of field images. When used with EDS detectors attached to each SEM, the chemical composition of surface features is quickly attained. While often used for metals and minerals, the MES beam lab includes a variable pressure system capable of analyzing non-conductive samples (such as polymers) with minimal preparation.
Analysis by SEM provides a unique depth of field advantage over optical microscopes, allowing the user to focus on irregular fracture surfaces. Our superior instrumentation allows us to provide exemplary service at very competitive prices.
High Magnification Imaging – up to 300,000x
Examination of fractured surfaces
Semi-quantitative chemical analysis by EDS
Evaluation of crystallographic orientation
Low cost chemical and contaminant identification
Analysis of metals, polymers, and minerals
ASTM B748 - Metallic Coating Thickness Measurements
ASTM E766 - Calibrating the Magnification of SEM
Sample Size – up to 8 in. diameter and 3 in. in height